210E-SPV / Wafer Measurement / Semiconductor Diagnostics SDI 210, 210E-SPV, FAST, Wafer Measurement, 423274 / SDI, Semiconductor Diagnostics Inc /
Delivery Ship within 3 DAYS after payment received
Warranty No warranty
Condition OEM: Used Working, Untested
0 available
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- Wafer sizeunknown
- Delivery ServiceStandard service (1 to 9 business days)
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- Confirmed out of stock 2023/01/17 05:54:58 - LAYLA Support
This listing was ended by the seller because the item is no longer available. : 2023/01/17 05:54:58 - LAYLA Support - Item spec:
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